DocumentCode :
436778
Title :
TID and SEU testing of hall effect sensor
Author :
Laa, C. ; Larsson, S.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
567
Lastpage :
570
Keywords :
Aerospace testing; Coils; Hall effect devices; Leakage current; Magnetic field measurement; Magnetic sensors; Magnetic switching; Performance evaluation; Single event upset; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442540
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436778
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