DocumentCode :
436781
Title :
Elevated temperature irradiation at high dose rate of commercial linear bipolar ICs
Author :
Boch, J. ; Saigne, F. ; Schrimpf, R.D. ; Fleetwood, D.M. ; Cizmarik, R. ; Zander, D.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
587
Lastpage :
592
Keywords :
Analog integrated circuits; Bipolar integrated circuits; Bipolar transistors; Degradation; Performance evaluation; Protons; Semiconductor device manufacture; Space charge; Temperature distribution; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442544
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436781
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