Title :
MeV neutron-induced SEU in SRAM devices
Author :
Flament, O. ; Baggio, J. ; Hose, C.D. ; Gasiot, G. ; Leray, J.L.
Keywords :
Analytical models; CMOS technology; Life estimation; Manufacturing; Neutrons; Power measurement; Power supplies; Random access memory; Single event upset; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
