Title :
High temperature embedded power module
Author :
Yin, Jim ; Liang, Zhenxian ; van Wyk, J.D.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
This new research develops the high temperature integrated power electronics module for applications involving high density, high efficiency and high environmental temperature (e.g those over 200 °C). High temperature electronic components and proper materials to package these components are applied to the state-of-the-art technology of embedded power module, which is a hybrid MCM-based 3-D integration packaging technology developed for the integrated power electronics module application. The high temperature stress analysis and high temperature packaging technologies are further studied to develop the high temperature module. The fabrication process of this innovative high temperature embedded power module is presented and the working modules have been tested up to 250 °C.
Keywords :
integrated circuit packaging; power electronics; fabrication process; high temperature embedded power module; hybrid MCM-based 3-D integration packaging technology; integrated power electronics module; Electronic packaging thermal management; Electronics packaging; Integrated circuit technology; Multichip modules; Power electronics; Semiconductor device packaging; Semiconductor materials; Silicon carbide; Temperature; Thermal stresses;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2005. APEC 2005. Twentieth Annual IEEE
Print_ISBN :
0-7803-8975-1
DOI :
10.1109/APEC.2005.1452953