Title :
Low-power thermal isolation for environmentally resistant microinstruments
Author :
Lee, Sang-Hyun ; Chae, Junseok ; Yoon, Sungwon ; Yazdi, Navid ; Najafi, Khalil
Author_Institution :
Center for Wireless Integrated MicroSystems, Michigan Univ., Ann Arbor, MI, USA
fDate :
30 Jan.-3 Feb. 2005
Abstract :
This paper reports the design and analysis of a generic thermal isolation platform that can support a variety of MEMS devices and isolate them from the environment. The platform provides high thermal isolation from the environment by employing long meandering and hollow support metal beams. This isolation is needed for low power (<10mW) micro oven controlled constant temperature operation over a -50∼70 °C temperature range. These beams also provide mechanical support. Optimal selection of the thermal and mechanical characteristics of these beams depends on many factors including beam materials, shape and structure, and the number of electrical signals. Metal only, meandering and hollow beams provide the highest thermal isolation and mechanical stiffness. The combination of the isolation platform batch fabrication process and wafer level instrument transfer/assembly onto the platform enables its broad and cost effective application.
Keywords :
beams (structures); isolation technology; micromechanical devices; temperature control; thermal stability; 50 to 70 C; MEMS devices; beam materials; beam structure; beams shape; environmentally resistant microinstruments; mechanical characteristics; mechanical stiffness; mechanical support; oven controlled constant temperature operation; thermal characteristics; thermal isolation platform; wafer bonding; wafer level assembly; wafer level instrument transfer; Assembly; Fabrication; Level control; Microelectromechanical devices; Ovens; Shape; Temperature control; Temperature distribution; Thermal factors; Thermal resistance;
Conference_Titel :
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
Print_ISBN :
0-7803-8732-5
DOI :
10.1109/MEMSYS.2005.1453984