• DocumentCode
    437725
  • Title

    Four-channel current-mode VLSI shaping amplifier with selectable time constant for high resolution X-ray spectroscopy

  • Author

    Buzzetti, Siro ; Guazzoni, Chiara ; Longoni, Antonio

  • Author_Institution
    Dipt. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
  • Volume
    1
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    161
  • Abstract
    A four-channel shaping amplifier for high resolution spectroscopy has been designed and realized in 0.8 μm BiCMOS technology to process the signals coming from a new state of the art silicon drift detector composed by four elements. The 5th-order semi-Gaussian shaping function is obtained by means of a novel current mode topology based on current mirrors to amplify the time constants and on a current feedback technique to obtain complex conjugate poles. The proposed shaper allows the user to choose among four possible gains and two possible shaping-times. The slow shaping time (500 ns) is for best energy resolution measurements while the short one (167 ns) allows high rate measurements. The maximum dynamics for the input signal, coming from any kind of preamplifier, is 400 mV. The output signal can be taken both as a voltage and as a current. We have provided each channel with both a voltage-mode and a current-mode peak stretcher. The four stretched current outputs can be multiplexed on-chip to a single output pin. The noise performances are fully comparable with commercial instruments and the measured linearity is below ±0.5%.
  • Keywords
    BiCMOS integrated circuits; VLSI; X-ray apparatus; X-ray spectroscopy; current mirrors; drift chambers; energy measurement; nuclear electronics; preamplifiers; silicon radiation detectors; 0.8 mum; 167 ns; 400 mV; 500 ns; 5th-order semiGaussian shaping function; BiCMOS technology; complex conjugate poles; current feedback technique; current mirrors; current mode topology; current-mode peak stretcher; energy resolution measurements; four-channel current-mode VLSI shaping amplifier; high rate measurements; high resolution X-ray spectroscopy; linearity measurement; noise performances; on-chip multiplexing; output signal; preamplifier; selectable time constant; shaper; shaping-times; silicon drift detector; single output pin; stretched current outputs; time constant amplification; voltage-mode peak stretcher; BiCMOS integrated circuits; Energy measurement; Signal design; Signal processing; Signal resolution; Silicon; Spectroscopy; Time measurement; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462173
  • Filename
    1462173