High pressure GEM performance with argon, krypton and xenon gas mixtures

Author

Altunbas, M.C. ; Barasch, E.F. ; Maier, M.R. ; Bednarek, D. ; Rudin, S. ; Greenwald, A. ; Johnson, E. ; Pralle, M.

Author_Institution

Dept. of Phys., SUNY, Buffalo, NY, USA

Volume

1

fYear

2004

fDate

16-22 Oct. 2004

Firstpage

554

Abstract

Using a double GEM we were not able to operate with gas gains as high as 1000 in gas mixtures employing CO₂, ethane, and propane quenchers at pressures above 2.0 bar in xenon and 3.0 bar in krypton. However, a trinary mixture of Ar/ethane/DME 78.5/20/1.5 allowed stable performance at 8.0 bar (absolute). Exchanging our double GEM for a quadruple GEM then combining this trinary mixture at the 20% level with Kr (Xe) resulted in improved performance with maximum operating pressures of 4.0 bar for Xe and 7.0 bar for Kr mixtures. Importantly, we also added additional heavy quencher by passing the mixed gases over a reservoir containing methylal (TEA).

Keywords

gas scintillation detectors; particle calorimetry; position sensitive particle detectors; semiconductor counters; 4.0 bar; 7.0 bar; CO₂ quencher; Kr mixture; Xe mixture; argon-ethane-DME mixture; double GEM; ethane quencher; gas gains; gas mixtures; heavy quencher; high pressure GEM; methylal; propane quencher; quadruple GEM; Argon; Attenuation; Detectors; Electromagnetic wave absorption; Physics; Resistors; Tungsten; Voltage; X-ray imaging; Xenon;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2004 IEEE

ISSN

1082-3654

Print_ISBN

0-7803-8700-7

Electronic_ISBN

1082-3654

Type

conf

DOI

10.1109/NSSMIC.2004.1462256

Filename

1462256