Author :
Ichimiya, R. ; Tsuji, S. ; Arai, Y. ; Ikeno, M. ; Sasaki, O. ; Ohshita, H. ; Takada, N. ; Hane, Y. ; Hasuko, K. ; Nomoto, H. ; Sakamoto, H. ; Shibuya, K. ; Takemoto, T. ; Fukunaga, C. ; Toshima, K. ; Sakuma, T.
Abstract :
The ATLAS end-cap muon level-1 trigger system is divided into three parts: one off-detector part and two on-detector parts. Application specific IC (ASIC) and FPGA (Actel anti-fuse) are actively used in on-detector parts. Data transfer with LVDS is used between two on-detector parts (15 m apart) and G-link with optical transmission (90 m) is used from one of the on-detector parts to the off detector part. These components will suffer for ten years the radiation of approximately 200 Gy of total ionizing dose (TID) and a hadron fluence of 2×1010 hadrons/cm2. We have investigated systematically the radiation susceptibility to both total ionizing dose and single event effects for ASIC, FPGA, and commercial off the shelf (COTS) serializer and deserializer chipsets for LVDS (two candidates) and G-link (one) together. In this presentation we report the result of irradiation tests for these devices and discuss their validity to use in the system.
Keywords :
application specific integrated circuits; field programmable gate arrays; ion beam effects; muon detection; position sensitive particle detectors; 10 year; 15 m; 90 m; ASIC; ATLAS level-1 muon endcap trigger system; Actel antifuse; FPGA; G-link; LVDS; application specific IC; commercial off the shelf deserializer chipset; commercial off the shelf serializer chipset; data transfer; electronics components; hadron fluence; irradiation tests; off-detector part; on-detector parts; optical transmission; radiation qualification; radiation susceptibility; single event effects; total ionizing dose; Application specific integrated circuits; CMOS technology; Electronic components; Field programmable gate arrays; Ionizing radiation; Level measurement; Mesons; Optical receivers; Optical transmitters; Qualifications;
