• DocumentCode
    437859
  • Title

    Simulation of signals in ultra radiation-hard silicon pixel detectors

  • Author

    Lari, T. ; Troncon, C.

  • Author_Institution
    INFN, Milan, Italy
  • Volume
    2
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    908
  • Abstract
    A detailed simulation of silicon pixel detectors irradiated to very high fluences, in the range foreseen for vertex detectors after the Large Hadron Collider luminosity upgrade, is presented. The charge collection properties and the detector response were computed for different silicon materials (standard float zone, diffusion oxygenated float zone, Czochralski, epitaxial silicon) and operating conditions. At the maximum fluence (1016 neqcm-2) the signal is limited by charge trapping rather than by the thickness of the active volume. Since all the silicon materials studied so far have a similar trapping cross section, they are all expected to collect a signal of 2000-2500 electrons at 600 V bias voltage. A detection threshold of 1000-1200 electrons is required in order to have a 97% detection efficiency.
  • Keywords
    position sensitive particle detectors; radiation hardening (electronics); silicon radiation detectors; 600 V; Czochralski silicon; Large Hadron Collider luminosity upgrade; active volume thickness; bias voltage; charge collection properties; charge trapping; detection efficiency; detection threshold; detector response; diffusion oxygenated float zone silicon; epitaxial silicon; maximum fluence; signal simulation; trapping cross section; ultraradiation-hard silicon pixel detectors; vertex detectors; Computational modeling; Electron traps; Large Hadron Collider; Neutrons; Radiation detectors; Silicon radiation detectors; Space charge; Substrates; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462354
  • Filename
    1462354