DocumentCode
437859
Title
Simulation of signals in ultra radiation-hard silicon pixel detectors
Author
Lari, T. ; Troncon, C.
Author_Institution
INFN, Milan, Italy
Volume
2
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
908
Abstract
A detailed simulation of silicon pixel detectors irradiated to very high fluences, in the range foreseen for vertex detectors after the Large Hadron Collider luminosity upgrade, is presented. The charge collection properties and the detector response were computed for different silicon materials (standard float zone, diffusion oxygenated float zone, Czochralski, epitaxial silicon) and operating conditions. At the maximum fluence (1016 neqcm-2) the signal is limited by charge trapping rather than by the thickness of the active volume. Since all the silicon materials studied so far have a similar trapping cross section, they are all expected to collect a signal of 2000-2500 electrons at 600 V bias voltage. A detection threshold of 1000-1200 electrons is required in order to have a 97% detection efficiency.
Keywords
position sensitive particle detectors; radiation hardening (electronics); silicon radiation detectors; 600 V; Czochralski silicon; Large Hadron Collider luminosity upgrade; active volume thickness; bias voltage; charge collection properties; charge trapping; detection efficiency; detection threshold; detector response; diffusion oxygenated float zone silicon; epitaxial silicon; maximum fluence; signal simulation; trapping cross section; ultraradiation-hard silicon pixel detectors; vertex detectors; Computational modeling; Electron traps; Large Hadron Collider; Neutrons; Radiation detectors; Silicon radiation detectors; Space charge; Substrates; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1462354
Filename
1462354
Link To Document