DocumentCode :
437914
Title :
Design and characterization of a novel, radiation-resistant active pixel sensor in a standard 0.25 μm CMOS technology
Author :
Villani, Enrico Giulio ; Allport, P.P. ; Casse, G. ; Evans, A. ; Tyndel, M. ; Turchetta, R. ; Velthuis, J.J.
Author_Institution :
Rutherford Appleton Lab., Didcot, UK
Volume :
2
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
1222
Abstract :
CMOS monolithic active pixel sensors are currently developed for particle physics vertex detectors. Their radiation resistance has already been proved to be high enough for the devices to be used at machines like the linear collider, where the radiation fluence is expected to be of the order of 1012 proton/cm2. However, in order to address more radiation-harsh environments, we proposed a novel sensor structure based on the deep N-well, which is found in triple-well CMOS technologies. Potential benefits arising from this technology are investigated and simulation results for standard and novel structure compared.
Keywords :
CMOS image sensors; position sensitive particle detectors; semiconductor counters; CMOS monolithic active pixel sensors; deep N-well; linear collider; particle physics vertex detectors; radiation-harsh environments; radiation-resistant active pixel sensor; sensor structure; triple-well CMOS technologies;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462422
Filename :
1462422
Link To Document :
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