DocumentCode
437944
Title
An integrated CMOS baseline restorer based on a switched current-conveyor
Author
Pullia, A. ; Maiocchi, D. ; Bertuccio, G. ; Caccia, S.
Author_Institution
Dept. of Phys., Milan Univ., Italy
Volume
3
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
1396
Abstract
We present a fully integrated CMOS gated baseline restorer for shaper amplifiers with shaping times of up to 10 mus. As is well known a baseline restorer can be thought of as a switched C-R network. A switch enables the C-R differentiator along the baseline and excludes it on the signal. At moderate count rates, time constant CR should be chosen equal or larger than three times the shaping time (taus), otherwise the signal-to-noise ratio of the system would worsen significantly. If taus is of the order of 10 mus, a recovery time as long as 30 mus must be used in the baseline restorer. A so-long time constant cannot he realized with a passive network in an integrated circuit, because large-value capacitors and resistors require a too large chip area. We have addressed this issue by using a switchable current-conveyor structure that behaves like a large-value resistor. A switch permits to exclude the current-conveyor equivalent resistor when signals occur. The gate signal is provided by an amplitude discriminator, placed at the baseline-restorer output.
Keywords
CMOS integrated circuits; amplifiers; discriminators; switched current circuits; 10 mus; 30 mus; C-R differentiator; amplitude discriminator; baseline-restorer output; capacitors; chip area; count rates; current-conveyor equivalent resistor; fully integrated CMOS gated baseline restorer; gate signal; integrated circuit; passive network; recovery time; shaper amplifiers; shaping times; signal-noise ratio; switchable current-conveyor structure; switched C-R network; switched current-conveyor; time constant; Capacitors; Chromium; Circuits; Mirrors; Passive networks; Resistors; Signal restoration; Signal to noise ratio; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location
Rome
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1462501
Filename
1462501
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