• DocumentCode
    437944
  • Title

    An integrated CMOS baseline restorer based on a switched current-conveyor

  • Author

    Pullia, A. ; Maiocchi, D. ; Bertuccio, G. ; Caccia, S.

  • Author_Institution
    Dept. of Phys., Milan Univ., Italy
  • Volume
    3
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    1396
  • Abstract
    We present a fully integrated CMOS gated baseline restorer for shaper amplifiers with shaping times of up to 10 mus. As is well known a baseline restorer can be thought of as a switched C-R network. A switch enables the C-R differentiator along the baseline and excludes it on the signal. At moderate count rates, time constant CR should be chosen equal or larger than three times the shaping time (taus), otherwise the signal-to-noise ratio of the system would worsen significantly. If taus is of the order of 10 mus, a recovery time as long as 30 mus must be used in the baseline restorer. A so-long time constant cannot he realized with a passive network in an integrated circuit, because large-value capacitors and resistors require a too large chip area. We have addressed this issue by using a switchable current-conveyor structure that behaves like a large-value resistor. A switch permits to exclude the current-conveyor equivalent resistor when signals occur. The gate signal is provided by an amplitude discriminator, placed at the baseline-restorer output.
  • Keywords
    CMOS integrated circuits; amplifiers; discriminators; switched current circuits; 10 mus; 30 mus; C-R differentiator; amplitude discriminator; baseline-restorer output; capacitors; chip area; count rates; current-conveyor equivalent resistor; fully integrated CMOS gated baseline restorer; gate signal; integrated circuit; passive network; recovery time; shaper amplifiers; shaping times; signal-noise ratio; switchable current-conveyor structure; switched C-R network; switched current-conveyor; time constant; Capacitors; Chromium; Circuits; Mirrors; Passive networks; Resistors; Signal restoration; Signal to noise ratio; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • Conference_Location
    Rome
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462501
  • Filename
    1462501