IDeF-X ASIC for Cd(Zn)Te spectro-imaging systems

Author

Limousin, O. ; Gevin, O. ; Lugiez, F. ; Chipaux, R. ; Delagnes, E. ; Dirks, B. ; Horeau, B.

Author_Institution

CEA Saclay, Gif-sur-Yvette, France

Volume

3

fYear

2004

fDate

16-22 Oct. 2004

Firstpage

1403

Abstract

Joint progresses in Cd(Zn)Te detectors, microelectronics and interconnection technologies open the way for a new generation of instruments for physics and astrophysics applications in the energy range from 1 to 1000 keV. Even working between -20 and 20degC, these instruments will offer high spatial resolution (pixel size ranging from 300 times 300 mum² to few mm²), high spectral response and high detection efficiency. To reach these goals, reliable, highly integrated, low noise and low power consumption electronics is mandatory. Our group is currently developing a new ASIC detector front-end named IDeF-X, for modular spectro-imaging system based on the use of Cd(Zn)Te detectors. We present here the first version of IDeF-X which consists in a set of ten low noise charge sensitive preamplifiers (CSA). It has been processed with the standard AMS 0.35 mum CMOS technology. The CSA´s are designed to be DC coupled to detectors having a low dark current at room temperature. The various preamps implemented are optimized for detector capacitances ranging from 0.5 up to 30 pF.

Keywords

CMOS integrated circuits; X-ray detection; X-ray spectrometers; application specific integrated circuits; nuclear electronics; particle spectrometers; position sensitive particle detectors; preamplifiers; semiconductor counters; semiconductor device noise; -20 to 20 degC; 0.35 mum; 0.5 to 30 pF; 1 to 1000 keV; 300 mum; ASIC detector front-end; CMOS technology; Cd(Zn)Te detectors; Cd(Zn)Te spectro-imaging systems; DC coupled charge sensitive preamplifiers; astrophysics applications; dark current; detection efficiency; detector capacitances; highly integrated electronics; imaging detector front-end; interconnection technologies; low noise charge sensitive preamplifiers; low noise electronics; low power consumption electronics; microelectronics; modular spectro-imaging system; physics applications; pixel size; spatial resolution; spectral response; Application specific integrated circuits; Astrophysics; CMOS technology; Detectors; Energy consumption; Instruments; Microelectronics; Physics; Power system reliability; Spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2004 IEEE

Conference_Location

Rome

ISSN

1082-3654

Print_ISBN

0-7803-8700-7

Electronic_ISBN

1082-3654

Type

conf

DOI

10.1109/NSSMIC.2004.1462503

Filename

1462503