DocumentCode :
438172
Title :
Characterization of blue- and red- very small aperture lasers for hybrid recording
Author :
Ohno, Tomoki ; Bain, J.A. ; Schlesinger, T.E.
Author_Institution :
Sharp Lab. of America Inc., Camas, WA, USA
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
31
Lastpage :
32
Abstract :
The characterization of a rectangular aperture on a very small aperture laser (VSAL) is described and the parameters of interest to hybrid recording technology is quantified. VSALs based on blue laser diodes (LDs) (λ = 405 nm) and red-LDs (λ = 658 nm) with 100 nm × 200 nm rectangular apertures milled into 50 nm thick aluminum by focused ion beam etching (FIBE) are fabricated and their slope efficiencies (SE) captured by a NA 0.65 objective lens in the far field (FF) measured. SE is defined as the-ratio of the measured optical power to the input current. The background SEs (BSE) were measured after coating with Al but prior to forming the aperture for reference. The SEs of these blue and red lasers with apertures were 2.7 mW/A (BSE = 1.3 mW/A) and 3.8 mW/A (BSE = 0.3 mW/A), respectively. Detailed characterization of both lasers before and after aperture fabrication indicate that this greater SE of the red VSAL is primarily due to greater efficiency of coupling between the laser and the aperture, ηcoupling, and greater transmission efficiency of the aperture, ηaperture, in the red. It is not due to difference in the SBs of the two LDs themselves. Near field simulation of the apertures using the finite difference time domain (FDTD) method supports the above conclusions.
Keywords :
aluminium; finite difference time-domain analysis; focused ion beam technology; magneto-optical recording; milling; semiconductor lasers; sputter etching; 100 nm; 200 nm; 405 nm; 50 nm; 658 nm; Al; FDTD method; FIBE; NA; aperture fabrication; blue-very small aperture lasers; coating; coupling efficiency; far field; finite difference time domain method; focused ion beam etching; hybrid recording; input current; laser diodes; milling; near field simulation; objective lens; optical power; rectangular aperture; red-very small aperture lasers; slope efficiencies; transmission efficiency; Aluminum; Apertures; Diode lasers; Etching; Finite difference methods; Ion beams; Lenses; Optical coupling; Thickness measurement; Time of arrival estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463444
Filename :
1463444
Link To Document :
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