Title :
Lorentz microscopy studies of domain wall trap structures
Author :
McVitie, S. ; Brownlie, C. ; Chapman, J.N. ; Wilkinson, C.D.W.
Author_Institution :
Dept. of Phys. & Astron., Glasgow Univ., UK
Abstract :
Initial results on domain wall trap structures fabricated by electron beam lithography are described based on those proposed by micromagnetic simulations. The trap structures are made from thermally evaporated permalloy (Ni81Fe19) with thickness of 20 nm. Characterisation of the magnetic behaviour of the structures is carried out using the Fresnel mode of Lorentz microscopy as practised in a transmission electron microscope.
Keywords :
Permalloy; electron beam lithography; magnetic domain walls; magnetic thin films; micromagnetics; transmission electron microscopy; 20 nm; Fresnel mode; Lorentz microscopy; Ni81Fe19; domain wall trap structures; electron beam lithography; magnetic behaviour; micromagnetic simulations; thermally evaporated permalloy; transmission electron microscope; Geometry; Magnetic anisotropy; Magnetic domain walls; Magnetic domains; Magnetic heads; Perpendicular magnetic anisotropy; Proposals; Saturation magnetization; Strips; Transmission electron microscopy;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1463526
