DocumentCode :
438229
Title :
Mechanism of the softness of high Bs Fe-Co-Al-O films with a thin underlayer
Author :
Shintaku, K. ; Watanabe, S.
Author_Institution :
Akita Res. Inst. of Adv. Technol., Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
567
Lastpage :
568
Abstract :
The mechanism of the softness of high saturation magnetic flux density (Bs) Fe-Co-Al-O films with a thin underlayer is studied. In order to investigate the origin, the structural analysis was carried out by X-ray diffraction (XRD) measurements and transmission electron microscope (TEM) observation in detail. Fe-Co-Al-O films were prepared by RF magnetron sputtering in an Ar gas atmosphere. The film was deposited in Si/SiO2 substrate at 20°C. Magnetization curves were measured by a vibrating sample magnetometer (VSM).
Keywords :
X-ray diffraction; aluminium compounds; cobalt compounds; iron compounds; magnetic flux; magnetic thin films; magnetisation; soft magnetic materials; sputter deposition; transmission electron microscopy; 20 degC; FeCoAlO; RF magnetron sputtering; Si-SiO2; TEM; XRD; magnetic flux density; magnetization curves; softness; thin underlayer; vibrating sample magnetometer; Atmospheric measurements; Magnetic analysis; Magnetic films; Magnetic flux; Magnetic flux density; Radio frequency; Saturation magnetization; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463712
Filename :
1463712
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=438229
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