DocumentCode :
438283
Title :
Low-frequency noise analysis of TMR heads
Author :
Saruki, S. ; Kiyono, H. ; Fukuda, K. ; Kuwashima, T. ; Hachisuka, N. ; Inage, K. ; Kagami, T. ; Uesugi, T. ; Miura, S. ; Barada, K. ; Takahashi, N. ; Ohta, N. ; Kasahara, N. ; Sato, K. ; Kanaya, T. ; Kobayashi, A.
Author_Institution :
Head Bus. Group, TDK Corp., Nagano, Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1225
Lastpage :
1226
Abstract :
1/f noise as time traces of the fluctuation and low-frequency noise (pulse noise) were observed in TMR heads. These were then related to the quality of the oxide layer in the TMR heads.
Keywords :
1/f noise; magnetic heads; magnetic recording noise; tunnelling magnetoresistance; 1/f noise; TMR heads; fluctuation; low-frequency noise; low-frequency noise analysis; pulse noise; Breakdown voltage; Fluctuations; Giant magnetoresistance; Low-frequency noise; Magnetic heads; Magnetic noise; Noise measurement; Pulse measurements; Resistors; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464042
Filename :
1464042
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=438283
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