Title :
FePt ordered alloy thin film prepared by 30 seconds annealing with Fe-O under-layer
Author :
Yano, A. ; Koda, T. ; Matsunuma, S.
Author_Institution :
Dev. & Technol., Hitachi Maxell Ltd., Tsukuba, Japan
Abstract :
An Fe-O underlayer formed by reactant sputtering with oxygen is applied as an under layer for c-axis orientation control of FePt ordered alloy thin film. The layered film is then annealed in vacuum by infrared lamp heater for 30 seconds. The magnetic properties and crystallographic structures of the film are studied by means of resonating sample magnetometer and X-ray diffractometer, respectively. It is found that the Fe-O underlayer induces high perpendicular anisotropy. From this result, it is considered that application of Fe-O underlayer and infrared annealing is a useful technique in producing FePt ordered alloy perpendicular magnetic recording media.
Keywords :
X-ray diffraction; annealing; crystal structure; ferromagnetic materials; iron alloys; iron compounds; magnetic thin films; metallic thin films; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; sputtered coatings; 30 sec; FePt-FeO; X-ray diffractometer; crystallographic structures; infrared annealing; infrared lamp heater; layered film; magnetic properties; magnetic recording media; perpendicular anisotropy; reactant sputtering; resonating sample magnetometer; thin film; underlayer; Annealing; Crystallography; Infrared heating; Lamps; Magnetic films; Magnetic properties; Magnetometers; Position control; Sputtering; Transistors;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464121
