• DocumentCode
    438308
  • Title

    Investigation on wear and recession of the GMR head in helical-scan tape system

  • Author

    Kawakami, K. ; Kamatani, Y. ; Kondo, Makoto ; Ozue, T. ; Onodera, S.

  • Author_Institution
    Dept. of ATS Dev., Sony Corp., Kanagawa, Japan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    14.05
  • Lastpage
    14.06
  • Abstract
    Using the shielded spin-valve GMR head and the optimized metal evaporated tape in helical-scan tape system, it is almost feasible to achieve areal density at 11.5 Gb/in2. This is because of the signal-to-noise performance of electromagnetic property. In practice, however, it is necessary to eliminate the problem of the head wear of the GMR head more than it is to increase performance of the electromagnetic properties. One approach is to modify the head microstructure, changing it into the flux guide type at the expense of the electromagnetic properties. Another thing is to manage to do so without electromagnetic property deterioration, using the shielded spin-valve GMR head. In this report, we have investigated the latter approach and not only estimated the wear quantity of the GMR head but also measured its recession quantity in accelerated dust environment, taking into consideration the actual operating conditions.
  • Keywords
    giant magnetoresistance; magnetic heads; magnetic recording; magnetoresistive devices; tape recorders; wear; accelerated dust environment; electromagnetic property; flux guide type head; giant magnetoresistance; head microstructure; head wear; helical-scan tape system; optimized metal evaporated tape; recession quantity; shielded spin-valve GMR head; signal-to-noise performance; Acceleration; Electromagnetic measurements; Electromagnetic shielding; Electrostatic discharge; Magnetic heads; Microstructure; Streaming media; Temperature; Testing; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464132
  • Filename
    1464132