• DocumentCode
    438314
  • Title

    Current-induced electroresistance in CMR materials La1-xBaxMnO3

  • Author

    Hu, F.X. ; Gao, I. ; Wang, Z.H.

  • Author_Institution
    Dept. of Phys., Hong Kong Univ., China
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1467
  • Lastpage
    1468
  • Abstract
    The influence of a transport dc current on electric resistance has been investigated in epitaxial thin films La1-xBaxMnO3 (x = 0.1, 0.3), which typically shows CMR (colossal magnetoresistance) effect. Attention was focused at the influence of the applied dc current on the resistance in the absence of a magnetic field. Significant change of ratio of the peak resistance at different currents was found. The reduction of the peak resistance reaches ∼27%, and ∼13% with a current density up to 1.3 × 105 Acm-2, and 1.25 × 105 Acm-2 for x = 0.1, and 0.3 film, respectively. The current-induced electroresistance in film x = 0.1 is larger than that of x = 0.3 at any applied current density, which is consistent with the observed CMR effect. The film x = 0.1 also shows larger CMR than x = 0.3 at any applied magnetic field. The action of a current density of 1.3 × 105 Acm-2, for the both cases, was found to be equivalent to the MR effect caused by 1.5 T near Curie temperature TC. The phenomenon that the resistance in CMR manganites could be easily controlled by the electric current should be of high interest for both fundamental research and practical application.
  • Keywords
    Curie temperature; barium compounds; colossal magnetoresistance; current density; electrical resistivity; lanthanum compounds; magnetic epitaxial layers; 1.5 T; CMR; Curie temperature; La1-xBaxMnO3; colossal magnetoresistance; current density; current-induced electroresistance; epitaxial thin films; transport dc current; Colossal magnetoresistance; Current density; Electric resistance; Erbium; Magnetic fields; Magnetic films; Magnetic materials; Physics; Substrates; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464163
  • Filename
    1464163