Title :
Switching of magnetostrictive micro-dot arrays by mechanical strain
Author :
Bootsmann, M.-T. ; Dokupil, S. ; Quandt, E. ; Ivanov, T. ; Abedinov, N. ; Löhndorf, M.
Author_Institution :
Center of Adv. Eur. Studies, Bonn, Germany
Abstract :
CoFeBSi and FeCo magnetostrictive micro-and nano-dot arrays are fabricated on Si3N4 membranes with different diameters (50 to 300 μm) by combining MEMS fabrication processes and thin film technology. Compressive or tensile mechanical strain is introduced in order to observe the inverse magnetostriction effect or the Villary effect. Magnetic force microscopy and MOKE measurements are employed in order to investigate the strain induced switching properties and resolve the domain structure of the amorphous micro- and nano-dot arrays. The local strain distribution of the various membrane structures is obtained by finite-element method. The results of the simulations are then compared to the experimental results.
Keywords :
boron alloys; cobalt alloys; compressive strength; finite element analysis; iron alloys; magnetic domains; magnetic force microscopy; magnetic switching; magnetic thin films; magnetostriction; micromechanical devices; nanostructured materials; nanotechnology; noncrystalline structure; silicon alloys; tensile strength; CoFeBSi; FeCo; MEMS fabrication processes; Si3N4; Villary effect; amorphous microdot arrays; compressive strain; domain structure; finite-element method; magnetic force microscopy; magnetization switching; magnetostriction effect; magnetostrictive microdot arrays; magnetostrictive switching; mechanical strain; membrane structures; microdot arrays; nanodot arrays; strain distribution; tensile mechanical strain; thin film technology; Amorphous magnetic materials; Biomembranes; Fabrication; Magnetic field induced strain; Magnetic switching; Magnetostriction; Micromechanical devices; Semiconductor thin films; Strain measurement; Tensile strain;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464409