Title :
Tunnel magnetoresistance in magnetic tunnel junctions with a disordered Co2(Cr1-xFex)Al full-Heusler alloy film
Author :
Okamura, S. ; Miyazaki, A. ; Tezuka, N. ; Sugimoto, S. ; Inomata, K.
Author_Institution :
Dept. of Mater. Sci., Tohoku Univ., Sendai, Japan
Abstract :
The structural properties of Co2(Cr1-xFex)Al annealed at various temperatures and prepared on heated substrates are demonstrated. The TMR properties of MTJs with the disordered Co2(Cr1-xFex)Al is also shown. Magnetoresistance measurement of the MTJs was performed by using a four-point probe technique. Film structures and oxidization at surfaces and interfaces were characterized by using X-ray diffraction (XRD) (Cu-Kα) and X-ray photoelectron spectroscopy (XPS) (Al-Kα), respectively.
Keywords :
X-ray diffraction; X-ray photoelectron spectra; aluminium alloys; annealing; chromium alloys; cobalt alloys; ferromagnetic materials; iron alloys; magnetic thin films; tunnelling magnetoresistance; Co2(Cr1-xFex)Al; TMR; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; disordered full-Heusler alloy film; film structures; four-point probe technique; magnetic tunnel junctions; oxidization; tunnel magnetoresistance; Annealing; Chromium; Iron; Magnetic tunneling; Performance evaluation; Probes; Substrates; Temperature; Tunneling magnetoresistance; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464431
