DocumentCode :
438364
Title :
Room temperature stability study in silicon base magnetic tunneling transistor
Author :
Huang, Y.W. ; Lo, C.K. ; Yao, Y.D. ; Hsieh, L.C. ; Huang, D.R.
Author_Institution :
Dept. of Material Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
2005
Lastpage :
2006
Abstract :
The room temperature stability of a silicon base magnetic tunneling transistor fabricated by a magnetic tunneling junction (MTJ) with a p-n junction barrier prepared on a Si (100) substrate is reported. The collector current and the change of magnetocurrent (MC) at room temperature as a function of magnetic field at the emitter bias is investigated. The collector current varies from 4.2 μA at magnetically parallel state to 2.89 μA at magnetically anti-parallel state. The emitter voltage dependence of emitter currents and the transfer ratio at the parallel state were observed to increase as the emitter voltage (VE) is increased. MC of emitter and base currents decreases as VE goes up while the MC of the collector current reaches a maximum at VE of 1.2 V.
Keywords :
elemental semiconductors; magnetic tunnelling; magnetoelectric effects; magnetoelectronics; p-n junctions; silicon; tunnel transistors; 1.2 V; 4.2 to 2.89 muA; MTJ; Si; base currents; collector current; emitter bias; emitter currents; emitter voltage; magnetic tunneling junction; magnetically antiparallel state; magnetically parallel state; magnetocurrent; p-n junction barrier; silicon base magnetic tunneling transistor; Magnetic tunneling; P-n junctions; Polarization; Silicon; Solids; Stability; Temperature dependence; Temperature distribution; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464441
Filename :
1464441
Link To Document :
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