Title :
Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jungli, China
Abstract :
With the increasing demand for high-performance networking application, network components such as network interfaces and routers are built in dedicated hardware modulars. Content addressable memories (CAMs) play an important role in the network components. Testing CAMs is very complicated due to their special structure. This paper presents an efficient March-like test algorithm for detecting the comparison faults of ternary CAMs based on the comparison fault models of binary CAMs. The test algorithm requires 5N write operations, 2N erase operations, and (3N+2B) compare operations for an N × B-bit TCAM.
Keywords :
content-addressable storage; fault simulation; integrated circuit testing; logic testing; CAM testing; March-like test algorithm; binary CAM; compare operations; content addressable memories; erase operations; fault detection; fault testing; hardware modulars; network interfaces; network routers; ternary CAM; write operations; Associative memory; Automatic testing; CADCAM; Cams; Circuit faults; Circuit testing; Computer aided manufacturing; Fault detection; Logic testing; Signal generators;
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
DOI :
10.1109/ASPDAC.2005.1466131
