Title :
Maze routing with OPC consideration
Author :
Wu, Yun-Ru ; Tsai, Ming-Chao ; Wang, Ting-Chi
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
As the technology of manufacturing process continues to advance, the process variation becomes more and more serious in nanometer designs. Optical proximity correction (OPC) is employed to correct the process variation of the diffraction effect. To obtain the desired layout as early as possible, routers must have some changes to handle the optical effects to speed up the OPC time and to avoid the routing result that cannot be corrected by the OPC process. In this paper, we propose two practical OPC-aware maze routing problems and present how to enhance an existing maze routing algorithm to get an optimal algorithm for each problem. The experimental results are also given to demonstrate the effectiveness of these two enhanced algorithms.
Keywords :
integrated circuit layout; network routing; photolithography; proximity effect (lithography); diffraction effect; manufacturing process variation; maze routing; nanometer designs; optical effects; optical proximity correction; Computer science; Costs; Interference constraints; Lithography; Manufacturing processes; Optical diffraction; Optical sensors; Process control; Routing; Semiconductor device modeling;
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
DOI :
10.1109/ASPDAC.2005.1466157