• DocumentCode
    438429
  • Title

    An efficient control-oriented coverage metric

  • Author

    Verma, Shireesh ; Ramineni, K. ; Harris, Ian G.

  • Author_Institution
    Center for Embedded Comput. Syst., California Univ., Irvine, CA, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    18-21 Jan. 2005
  • Firstpage
    317
  • Abstract
    Coverage metrics, which evaluate the ability of a test sequence to detect design faults, are essential to the validation process. A key source of difficulty in determining fault detection is that the control flow path traversed in the presence of a fault cannot be determined. Fault detection can only be accurately determined by exploring the set of all control flow paths, which may be traversed as a result of a fault. We present a coverage metric that determines the propagation of fault effects along all possible faulty control flow paths. The complexity of exploring multiple control flow paths is greatly alleviated by heuristically pruning infeasible control flow paths using the algorithm that we present. The proposed coverage metric provides high accuracy in designs that contain complex control flow. The results obtained are promising.
  • Keywords
    fault diagnosis; integrated circuit testing; logic testing; control flow path; control-oriented coverage metric; design fault detection; test sequence; validation process; Circuit faults; Computational complexity; Embedded computing; Error correction; Fault detection; Petroleum; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
  • Print_ISBN
    0-7803-8736-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2005.1466181
  • Filename
    1466181