Title :
Zoom-in micro tomography with the combination of full and limited field-of-view projection data
Author :
Chun, Kon ; Lee, Sang Chul ; Cho, Myung Hye ; Cho, Min Hyoung ; Lee, Soo Yeol
Author_Institution :
Dept. of Biomed. Eng., Kyung Hee Univ.
Abstract :
In this paper, we introduce an X-ray microtomography system capable of high-resolution zoom-in imaging of a local region inside a large object. By combining two kinds of projection data, one from the full field-of-view (FOV) scan of the whole object and the other from the limited FOV scan of the region of interest, we have obtained zoomed-in images of the region of interest. With computer simulations, we have found that the proposed zoom-in imaging technique has superb spatial resolution, comparable to that of local tomography, without any contrast anomalies commonly appearing in conventional local tomography. To verify the zoom-in imaging capability experimentally, we have integrated a micro tomography system using a micro-focus X-ray source, a flat-panel CMOS X-ray detector with the matrix size of 1248times1248, and a precision scan mechanism. The mismatches between the two projection data caused by misalignments of the scan mechanism have been estimated with a calibration phantom and the mismatch effects have been compensated in the image reconstruction procedure. Zoom-in imaging results of bony tissues with the spatial resolution of 20 mum suggest that zoom-in microtomography can be greatly used for high resolution imaging of a local region in small animal imaging studies
Keywords :
CMOS image sensors; X-ray detection; bone; computerised tomography; image reconstruction; image resolution; phantoms; X-ray microtomography system; bony tissues; calibration phantom; computer simulations; computerised tomography; flat-panel CMOS X-ray detector; full field-of-view scan; high resolution imaging; high-resolution zoom-in imaging; image reconstruction; microfocus X-ray source; mismatch effects; precision scan mechanism; projection data; small animal imaging; spatial resolution; Calibration; Computer simulation; High-resolution imaging; Image reconstruction; Imaging phantoms; Optical imaging; Spatial resolution; Tomography; X-ray detectors; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1466307