DocumentCode
438602
Title
Efficiently generating test vectors with state pruning
Author
Chen, Ying ; Abts, Dennis ; Lilja, David J.
Author_Institution
Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Volume
2
fYear
2005
fDate
18-21 Jan. 2005
Firstpage
1196
Abstract
This paper extends the depth first search (DFS) used in the previously proposed witness string method for generating efficient test vectors. A state pruning method is added that exploits different search heuristics in simultaneous searches. Using an IBM Power4 multiprocessor system with the Berkeley Active Message library, we show that this new method of state pruning is efficient and produces quantitatively better witness strings compared to both pure and guided DFS.
Keywords
automatic test pattern generation; logic design; logic testing; multiprocessing systems; redundancy; Berkeley Active Message library; IBM Power4 multiprocessor system; state pruning; test vector generation; witness string method; Benchmark testing; Coherence; Computational complexity; Electrical equipment industry; Explosions; Hardware; Multiprocessing systems; Protocols; State-space methods; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN
0-7803-8736-8
Type
conf
DOI
10.1109/ASPDAC.2005.1466556
Filename
1466556
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