DocumentCode :
438602
Title :
Efficiently generating test vectors with state pruning
Author :
Chen, Ying ; Abts, Dennis ; Lilja, David J.
Author_Institution :
Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Volume :
2
fYear :
2005
fDate :
18-21 Jan. 2005
Firstpage :
1196
Abstract :
This paper extends the depth first search (DFS) used in the previously proposed witness string method for generating efficient test vectors. A state pruning method is added that exploits different search heuristics in simultaneous searches. Using an IBM Power4 multiprocessor system with the Berkeley Active Message library, we show that this new method of state pruning is efficient and produces quantitatively better witness strings compared to both pure and guided DFS.
Keywords :
automatic test pattern generation; logic design; logic testing; multiprocessing systems; redundancy; Berkeley Active Message library; IBM Power4 multiprocessor system; state pruning; test vector generation; witness string method; Benchmark testing; Coherence; Computational complexity; Electrical equipment industry; Explosions; Hardware; Multiprocessing systems; Protocols; State-space methods; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
Type :
conf
DOI :
10.1109/ASPDAC.2005.1466556
Filename :
1466556
Link To Document :
بازگشت