Title :
Analysis of interaction of gamma rays in crystals with 256ch parallel readout FP-PMT
Author :
Nishikido, Fumihiko ; Kikuchi, Jun ; Murayama, Hideo ; Inadama, Naoko ; Hasegawa, Tomoyuki
Abstract :
Many incident gamma rays into crystal arrays used in PET systems are absorbed after the Compton scattering. Scattering events deteriorate detector resolutions because with common PET detectors interaction positions are calculated by Anger method and calculated positions are located at middle of an actual interaction position. If analysis of the scattering events is possible, the position resolution could be improved. A 256 channel position sensitive flat panel photo multiplier tube (256ch FP-PMT) developed by Hamamtsu Photonics is suitable for this purpose. We construct new detector which consists of a GSO crystal block and the 256ch parallel readout FP-PMT to observe aspects of gamma rays interaction in crystals event by event. The system can estimate interaction positions and deposited energies by EM algorism from anode outputs recorded individually. We performed the experiment with this detector and compared the presented method with conventional methods. In the experiment, the detector can visualize spread of scintillation light and observe the aspect of scattering events.
Keywords :
Compton effect; gamma-ray interactions; optimisation; photomultipliers; position sensitive particle detectors; positron emission tomography; Anger method; Compton scattering; EM algorism; GSO crystal block; Gd2SiO5; Hamamtsu Photonics; PET detectors interaction position; PET systems; channel position resolution; channel position sensitive flat panel photo multiplier tube; crystal arrays; gamma rays interaction; parallel readout; scattering events; scintillation light; Anodes; Event detection; Gamma ray detection; Gamma ray detectors; Gamma rays; Light scattering; Particle scattering; Photonic crystals; Positron emission tomography; Solid scintillation detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1466620