DocumentCode
438671
Title
The NEC dependence of different scintillators for positron emission tomography
Author
Eriksson, L. ; Townsend, D. ; Eriksson, M. ; Casey, M.E. ; Conti, M. ; Bendriem, B. ; Nutt, R.
Author_Institution
CPS Innovations, Knoxville, TN, USA
Volume
6
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
3785
Abstract
In positron emission tomography (PET), the concept of noise equivalent count rate (NEC) is a measure of image quality. It has been shown that the local signal-to-noise ratio in the images reflects the global signal-to-noise ratio, which, in turn, can be related to the NEC. Factors that affect the NEC include the scanner geometry and scintillator material. The peak NEC has long been considered an indicator of PET scanner performance, whereas the sensitivity, represented by the slope of the NEC curve at the origin is equally important. This initial slope is proportional to the true coincidence sensitivity times the factor (1-SF), where SF is the scatter fraction. The peak NEC value is a strong function of scanner geometry and scintillator material, scatter fraction, system dead time and random coincidence fraction. The scatter fraction depends mainly on the low level discriminator setting of the system. Access to time-of-flight information may have a strong impact on the signal-to-noise properties and hence on the NEC performance. However, this work will focus specifically on the effect of the scintillator properties on the NEC, in particular the stopping power, light output, decay time and the interaction with the electronics. Three scintillators have been compared, the standard BGO, the fast high density LSO and a new fast, high light yield scintillator LaBr3. The scintillators have been compared for the fixed scanner geometry of the ECAT EXACT.
Keywords
biomedical equipment; image scanners; positron emission tomography; scintillation counters; BGO scintillator; LaBr3 scintillator; PET; decay time; discriminator setting; image quality; light output; lutetium orthosilicate scintillator; noise equivalent count rate dependence; positron emission tomography; random coincidence fraction; scanner geometry; scatter fraction; scintillator material; signal-to-noise ratio; system dead time; time-of-flight information; Biomedical imaging; Geometry; Image quality; Light scattering; National electric code; Noise measurement; Positron emission tomography; Signal to noise ratio; Solid scintillation detectors; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1466704
Filename
1466704
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