Title :
Imperceptible data embedding in sharply-contrasted binary images
Author :
Ho, Anthony T S ; Puhan, Niladri B. ; Makur, A. ; Marziliano, P. ; Guan, Y.L.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
Data embedding in sharply-contrasted binary images like text, drawing, signature and cartoon is a challenging issue due to simple pixel statistics in such images. Arbitrary modification to the pixels can be visually perceptible in the process of data embedding. The use of a valid perceptual model is important to minimize the effect of such visual distortion in binary images. In this paper, a novel perceptual model is used to embed significant amount of information such that the original and the marked images before and after data embedding process are perceptually similar. In our model, the distortion that occurs after flipping a pixel is estimated on the curvature-weighted distance difference (CWDD) measure between two contour segments.
Keywords :
curvature measurement; distortion; image resolution; image segmentation; arbitrary modification; contour segments; curvature-weighted distance difference measure; imperceptible data embedding; pixel flipping; sharply-contrasted binary images; simple pixel statistics; valid perceptual model; visual distortion; Data encapsulation; Data engineering; Engineering drawings; Humans; Image segmentation; Pixel; Protection; Robustness; Statistics; Watermarking;
Conference_Titel :
Control, Automation, Robotics and Vision Conference, 2004. ICARCV 2004 8th
Print_ISBN :
0-7803-8653-1
DOI :
10.1109/ICARCV.2004.1468970