Title :
Robust CMOS compander
Author_Institution :
Wolfson Microelectronics, Edinburgh, UK
Abstract :
An improved sigma-delta compander topology is described which has been used to implement a robust compander on a CMOS process. No external components are required and test time is reduced when compared to conventional compander implementations.
Keywords :
CMOS process; Circuit noise; Circuit testing; Delta-sigma modulation; Envelope detectors; Filters; Frequency; Noise level; Rectifiers; Robustness;
Conference_Titel :
Solid-State Circuits Conference, 1997. ESSCIRC '97. Proceedings of the 23rd European
Conference_Location :
Southampton, UK
