DocumentCode :
439395
Title :
Impact of indirect stability on phase noise performance of fully-integrated LC tuned VCOs
Author :
Samori, C. ; Lacaita, A.L. ; Zanchi, A. ; Levantino, S. ; Torrisi, F.
Author_Institution :
Politecnico di Milano, Milano, Italy
fYear :
1999
fDate :
21-23 Sept. 1999
Firstpage :
202
Lastpage :
205
Abstract :
The phase noise of a VCO integrated in a RF receiver, fabricated in high-speed bipolar technology is studied in detail. The limitations arising from the AM-to-PM noise conversion and the indirect stability of the circuit have been addressed, introducing experimental and simulation procedures for their assessment. We show that the sources of low-frequency noise, usually neglected, due to these effects become instead important and limit the VCO phase noise performance.
Keywords :
CMOS technology; Circuit testing; Inductors; Noise measurement; Phase measurement; Phase noise; Q factor; Radio frequency; Stability; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1999. ESSCIRC '99. Proceedings of the 25th European
Conference_Location :
Duisburg, Germany
Type :
conf
Filename :
1471131
Link To Document :
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