DocumentCode :
439405
Title :
Vertically integrated sensors for advanced imaging applications
Author :
Benthien, Stephan ; Lulé, Tarek ; Schneider, Bernd ; Wagner, Michael ; Verhoeven, Markus ; Böhm, Markus
Author_Institution :
Silicon Vision GmbH, Siegen, Germany
fYear :
1999
fDate :
21-23 Sept. 1999
Firstpage :
242
Lastpage :
245
Abstract :
A TFA (Thin Film on ASIC) image sensor is fabricated depositing an amorphous silicon thin film detector upon a CMOS ASIC. Two new TFA imager prototypes have recently been fabricated. HIRISE II (High Resolution Image Sensor) with 1024 × 128 pixels is an active pixel sensor suited for digital photography. LARS II (Lokalautoadaptiver Sensor) with 368 × 256 Pixels splits the illumination information into two signals, thereby providing a dynamic range of more than 120 dB, as required by automotive applications. Both prototypes include Correlated Double Sampling (CDS) and Double Delta Sampling (DDS) for efficient suppression of fixed pattern noise.
Keywords :
Amorphous silicon; Application specific integrated circuits; High-resolution imaging; Image sensors; Pixel; Prototypes; Sampling methods; Semiconductor thin films; Sputtering; Thin film sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1999. ESSCIRC '99. Proceedings of the 25th European
Conference_Location :
Duisburg, Germany
Type :
conf
Filename :
1471141
Link To Document :
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