• DocumentCode
    439405
  • Title

    Vertically integrated sensors for advanced imaging applications

  • Author

    Benthien, Stephan ; Lulé, Tarek ; Schneider, Bernd ; Wagner, Michael ; Verhoeven, Markus ; Böhm, Markus

  • Author_Institution
    Silicon Vision GmbH, Siegen, Germany
  • fYear
    1999
  • fDate
    21-23 Sept. 1999
  • Firstpage
    242
  • Lastpage
    245
  • Abstract
    A TFA (Thin Film on ASIC) image sensor is fabricated depositing an amorphous silicon thin film detector upon a CMOS ASIC. Two new TFA imager prototypes have recently been fabricated. HIRISE II (High Resolution Image Sensor) with 1024 × 128 pixels is an active pixel sensor suited for digital photography. LARS II (Lokalautoadaptiver Sensor) with 368 × 256 Pixels splits the illumination information into two signals, thereby providing a dynamic range of more than 120 dB, as required by automotive applications. Both prototypes include Correlated Double Sampling (CDS) and Double Delta Sampling (DDS) for efficient suppression of fixed pattern noise.
  • Keywords
    Amorphous silicon; Application specific integrated circuits; High-resolution imaging; Image sensors; Pixel; Prototypes; Sampling methods; Semiconductor thin films; Sputtering; Thin film sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1999. ESSCIRC '99. Proceedings of the 25th European
  • Conference_Location
    Duisburg, Germany
  • Type

    conf

  • Filename
    1471141