Title :
Robust digitization and digital non-uniformity correction in a single-chip CMOS camera
Author :
Koren, I. ; Ramacher, U. ; Geib, H. ; Kirmser, S. ; Heer, C. ; Schlussler, J. ; Dohndorf, J. ; Werner, J.
Author_Institution :
Infineon Technologies Inc., Munich, Germany
Abstract :
Analog circuitry, digitization and subsequent digital non-uniformity correction in a single-chip digital CMOS camera are described. The sensor array of 720 × 576 active pixels is followed by a simple circuit implementing correlated double sampling, sample-and-hold function and A/D conversion with minimum analog hardware. The non-uniformity introduced by parameter variations in the analog circuitry is digitally corrected, resulting in measured rest non-uniformity and noise of 0.4% rms of the saturation signal. This level of non-uniformity leads to image quality comparable to the CCD.
Keywords :
CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS image sensors; Digital cameras; Hardware; Image converters; Image sampling; Noise measurement; Robustness; Sensor arrays;
Conference_Titel :
Solid-State Circuits Conference, 1999. ESSCIRC '99. Proceedings of the 25th European
Conference_Location :
Duisburg, Germany