Self calibrating and adjustable CMOS pad driver for improved electromagnetic compatibility

A new self calibrating and adjustable CMOS pad driver for improved electromagnetic compatibility is presented. A variable, user defined output slew rate is achieved, independent of process, supply voltage, temperature and load variations. Measurements on a test chip proved the functionality and the improvements of the driver. For example, the deviation of a slope time from the nominal value by varying supply voltage and temperature was reduced from ±25% to ±5%.