• DocumentCode
    439535
  • Title

    Influence of substrate noise on RF performance

  • Author

    Leenaerts, Domine ; De Vreede, Peter

  • Author_Institution
    Philips Research Laboratories, Eindhoven, The Netherlands
  • fYear
    2000
  • fDate
    19-21 Sept. 2000
  • Firstpage
    328
  • Lastpage
    331
  • Abstract
    A low-ohmic substrate 0.25µm CMOS process has been chosen to carry out experiments to measure the effects of substrate noise on the performance of circuits operating at radio frequencies. Clock circuits give rise to substrate noise with spectral harmonics far into the RF band. These harmonics are injected into the signal path of RF circuitry as will be demonstrated. Clock planning is therefore a major issue in mixed-signal telecommunication.
  • Keywords
    Circuit noise; Clocks; Coupling circuits; Electrical capacitance tomography; Laboratories; MOSFET circuits; Noise measurement; RF signals; Radio frequency; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
  • Conference_Location
    Stockholm, Sweden
  • Type

    conf

  • Filename
    1471278