Title :
Influence of substrate noise on RF performance
Author :
Leenaerts, Domine ; De Vreede, Peter
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Abstract :
A low-ohmic substrate 0.25µm CMOS process has been chosen to carry out experiments to measure the effects of substrate noise on the performance of circuits operating at radio frequencies. Clock circuits give rise to substrate noise with spectral harmonics far into the RF band. These harmonics are injected into the signal path of RF circuitry as will be demonstrated. Clock planning is therefore a major issue in mixed-signal telecommunication.
Keywords :
Circuit noise; Clocks; Coupling circuits; Electrical capacitance tomography; Laboratories; MOSFET circuits; Noise measurement; RF signals; Radio frequency; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
Conference_Location :
Stockholm, Sweden