DocumentCode :
439543
Title :
Source-pulsed dynamic-threshold CMOS SRAMs for fast, portable applications
Author :
Bhavnagarwala, A.J. ; Kapoor, A. ; Meindl, J.D.
Author_Institution :
Georgia Institute of Technology, Atlanta, GA
fYear :
2000
fDate :
19-21 Sept. 2000
Firstpage :
360
Lastpage :
363
Abstract :
A novel quad-rail CMOS SRAM cell architecture that doubles cell read current, improves cell static noise margin (SNM) by 70%, increases cell immunity to SER, and lowers cell standby power by over an order of magnitude is proposed. These improvements over conventional 6T CMOS SRAM cells, verified with HSPICE simulations on a 0.18µm industrial process are achieved by implementing a scheme of WL transition triggered pulses on power, ground and substrate terminals of cell transistors that share a common WL.
Keywords :
Boosting; CMOS process; CMOS technology; Circuit stability; Electrical capacitance tomography; Geometry; MOSFET circuits; Random access memory; Threshold voltage; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
Conference_Location :
Stockholm, Sweden
Type :
conf
Filename :
1471286
Link To Document :
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