DocumentCode :
439562
Title :
A comparison of MOS varactors in fully-integrated CMOS LC VCO´s at 5 and 7 GHz
Author :
Ainspan, Herschel ; Plouchart, Jean-Olivier
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, N.Y.
fYear :
2000
fDate :
19-21 Sept. 2000
Firstpage :
447
Lastpage :
450
Abstract :
This paper examines the effect of the choice of MOS varactor on the performance of a CMOS negative resistance oscillator. The three most common MOS varactor structures (inversion, accumulation, and gated varactor) are combined with a spiral inductor over either deep trench oxide or a polysilicon patterned ground shield, to implement a matrix of six LC VCO´s in a 0.24-µm (0.18- µm Leff) SiGe BiCMOS technology[1]. Typical measured VCO phase noise is -119.7 dBc/Hz at a 1-MHz offset from a 5.67-GHz carrier, while drawing 1.6 mA from a 1.5-V supply, for a VCO figure of merit of-191 dBc/Hz.
Keywords :
BiCMOS integrated circuits; Germanium silicon alloys; Inductors; Noise measurement; Phase measurement; Phase noise; Silicon germanium; Spirals; Varactors; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
Conference_Location :
Stockholm, Sweden
Type :
conf
Filename :
1471306
Link To Document :
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