Title :
A 1K × 1K high dynamic range CMOS image sensor with on-chip programmable region of interest readout
Author :
Schrey, O. ; Huppertz, J. ; Filimonovic, G. ; Bussmann, A. ; Brockherde, W. ; Hosticka, B.J.
Author_Institution :
Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
Abstract :
An integrated 1024×1024 CMOS image sensor with programmable region of interest (ROI) readout and multi-exposure technique has been developed and successfully tested. Size and position of the ROI is programmed based on multiples of a minimum readout kernel of 32×32 pixels. Since the dynamic range of the irradiance normally exceeds the electrical dynamic range of the imager that can be covered using a single integration time a multi exposure technique has been implemented in the imager. Subsequent sensor images are acquired using different integration times and recomputed to form a single composite image. A newly developed algorithm performing the recomputation is presented. The chip has been realized in a 0.5µm n-well standard CMOS process. The pixel pitch is 10µm × 10µm and the total chip area is 164mm2.
Keywords :
CMOS image sensors; CMOS process; Circuit testing; Dynamic range; Image sensors; Layout; Lighting; Photodiodes; Reflectivity; Smart pixels;
Conference_Titel :
Solid-State Circuits Conference, 2001. ESSCIRC 2001. Proceedings of the 27th European
Conference_Location :
Villach, Austria