• DocumentCode
    439594
  • Title

    A 1K × 1K high dynamic range CMOS image sensor with on-chip programmable region of interest readout

  • Author

    Schrey, O. ; Huppertz, J. ; Filimonovic, G. ; Bussmann, A. ; Brockherde, W. ; Hosticka, B.J.

  • Author_Institution
    Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
  • fYear
    2001
  • fDate
    18-20 Sept. 2001
  • Firstpage
    97
  • Lastpage
    100
  • Abstract
    An integrated 1024×1024 CMOS image sensor with programmable region of interest (ROI) readout and multi-exposure technique has been developed and successfully tested. Size and position of the ROI is programmed based on multiples of a minimum readout kernel of 32×32 pixels. Since the dynamic range of the irradiance normally exceeds the electrical dynamic range of the imager that can be covered using a single integration time a multi exposure technique has been implemented in the imager. Subsequent sensor images are acquired using different integration times and recomputed to form a single composite image. A newly developed algorithm performing the recomputation is presented. The chip has been realized in a 0.5µm n-well standard CMOS process. The pixel pitch is 10µm × 10µm and the total chip area is 164mm2.
  • Keywords
    CMOS image sensors; CMOS process; Circuit testing; Dynamic range; Image sensors; Layout; Lighting; Photodiodes; Reflectivity; Smart pixels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2001. ESSCIRC 2001. Proceedings of the 27th European
  • Conference_Location
    Villach, Austria
  • Type

    conf

  • Filename
    1471343