DocumentCode
439596
Title
1.2 V 0.18 µm CMOS imager with column-level oversampling
Author
Fortier, J. ; Tarr, N.G. ; Swaminathan, A. ; Plett, C.
Author_Institution
Carleton University, Ottawa, Canada
fYear
2001
fDate
18-20 Sept. 2001
Firstpage
105
Lastpage
108
Abstract
A CMOS imager designed and fabricated in a 0.18 µm digital CMOS technology operating from a 1.2 V power supply is reported. The imager uses second-order oversampled delta-sigma modulator analog to digital conversion at the column level to achieve high dynamic range for this low supply voltage. In experimental tests the imager was shown capable of measuring input light levels ranging over 5 orders of magnitude.
Keywords
Analog-digital conversion; CMOS technology; Circuit noise; Delta modulation; Dynamic range; Dynamic voltage scaling; Pixel; Power supplies; Signal to noise ratio; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2001. ESSCIRC 2001. Proceedings of the 27th European
Conference_Location
Villach, Austria
Type
conf
Filename
1471345
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