Title :
1.2 V 0.18 µm CMOS imager with column-level oversampling
Author :
Fortier, J. ; Tarr, N.G. ; Swaminathan, A. ; Plett, C.
Author_Institution :
Carleton University, Ottawa, Canada
Abstract :
A CMOS imager designed and fabricated in a 0.18 µm digital CMOS technology operating from a 1.2 V power supply is reported. The imager uses second-order oversampled delta-sigma modulator analog to digital conversion at the column level to achieve high dynamic range for this low supply voltage. In experimental tests the imager was shown capable of measuring input light levels ranging over 5 orders of magnitude.
Keywords :
Analog-digital conversion; CMOS technology; Circuit noise; Delta modulation; Dynamic range; Dynamic voltage scaling; Pixel; Power supplies; Signal to noise ratio; Testing;
Conference_Titel :
Solid-State Circuits Conference, 2001. ESSCIRC 2001. Proceedings of the 27th European
Conference_Location :
Villach, Austria