DocumentCode
439663
Title
Built-in self-repair IC logic with area optimized error-correcting codes
Author
Kleihorst, Richard ; Benschop, Nico
Author_Institution
Philips Research Laboratories, Eindhoven, The Netherlands
fYear
2001
fDate
18-20 Sept. 2001
Firstpage
397
Lastpage
400
Abstract
Integrated Circuits (ICs) suffer from malfunctioning because of permanent production errors, and transient or permanent errors during operation. ICs can be made tolerant for these errors by building in self-repair. This is implemented by the use of (known) error correction codes. These are now optimized for minimum silicon area, which essentially differs from using the classical criterion of minimal code redundancy. As compared to majority voting, our area-optimized Hamming codes and product codes offer sufficient fault protection for less than half the silicon area overhead.
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2001. ESSCIRC 2001. Proceedings of the 27th European
Conference_Location
Villach, Austria
Type
conf
Filename
1471417
Link To Document