DocumentCode :
439787
Title :
Precision and robust CMOS voltage reference based on the work function difference of poly Si gate
Author :
Watanabe, H. ; Ando, S. ; Aota, H. ; Dainin, M. ; Chun, Y.J. ; Taniguchi, K.
Author_Institution :
Ricoh Co. Ltd., Osaka, Japan
fYear :
2002
fDate :
24-26 Sept. 2002
Firstpage :
387
Lastpage :
390
Abstract :
This paper presents a new precision and robust CMOS voltage reference consisting of two sets of pair transistors: One of the sets has negative temperature coefficient of their threshold voltage difference, while the other positive temperature coefficient. A main feature of the Voltage Reference is the use of pair transistors which ensures the accuracy of the reference circuit under process fluctuations. The measured results revealed without adjusting trimming that the voltage reference has (1)excellent reproducibility of the output voltage within ± 2%, (2)low temperature coefficient of less than 80ppm/°C and (3)low current consumption of 0.6µA.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
Conference_Location :
Florence, Italy
Type :
conf
Filename :
1471546
Link To Document :
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