• DocumentCode
    439811
  • Title

    A 0.7dB insertion loss CMOS-SOI antenna switch with more than 50dB isolation over the 2.5 to 5GHz band

  • Author

    Tinella, C. ; Fournier, J.M. ; Belot, D. ; Knopik, V.

  • Author_Institution
    IMEP, Grenoble-Cedex, France
  • fYear
    2002
  • fDate
    24-26 Sept. 2002
  • Firstpage
    483
  • Lastpage
    486
  • Abstract
    Taking full advantage of the high resistivity substrate and underlying oxide of SOI technology, a high performance CMOS SPDT T/R switch has been designed and fabricated in a partially depleted, 0.25µm SOI process. The targeted Bluetooth class II specifications have been fully fitted. The switch over the high resistivity substrate exhibits a 0.7dB insertion loss and a 50dB isolation at 2.4GHz; at 5GHz insertion loss and isolation are 1dB and 47dB respectively. The measured ICP1dBis +12dBm.
  • Keywords
    Bluetooth; CMOS process; CMOS technology; Conductivity; Insertion loss; Isolation technology; Radio frequency; Silicon on insulator technology; Substrates; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
  • Conference_Location
    Florence, Italy
  • Type

    conf

  • Filename
    1471570