DocumentCode :
439891
Title :
Phase noise improvement of deep submicron low-voltage VCO
Author :
Fong, N. ; Plett, C. ; Tarr, G. ; Plouchart, J.-O. ; Liu, D. ; Zamdmer, N. ; Wagner, L.
Author_Institution :
Carleton University, Canada
fYear :
2002
fDate :
24-26 Sept. 2002
Firstpage :
811
Lastpage :
814
Abstract :
A low-voltage wideband 3.0-5.0 GHz complementary VCO was designed and fabricated in an 0.13 µm SOI CMOS process [1]. Non-minimum gate length was used for NMOS to improve the phase noise by exploiting waveform symmetry, maximizing output swing and reducing transistor flicker noise without any penalty to VCO performance. A phase noise improvement of up to 8 dB was observed experimentally. At 1 V VDDand 3.0 GHz, the phase noise is - 122.5 dBc/Hz at 1MHz offset, and the power dissipation is 2.5mW.
Keywords :
1f noise; CMOS technology; Circuit noise; Frequency; Impedance; Jitter; Noise level; Phase noise; Semiconductor device noise; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
Conference_Location :
Florence, Italy
Type :
conf
Filename :
1471651
Link To Document :
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