DocumentCode :
439921
Title :
The results of precision microwave measurement of the internal parasitics of tunnel-diodes
Author :
Bandler, John W.
Volume :
13
fYear :
1967
fDate :
1967
Firstpage :
7
Lastpage :
7
Keywords :
Microwave measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1967 International
Conference_Location :
IEEE
Type :
conf
Filename :
1475020
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=439921
