• DocumentCode
    439931
  • Title

    Silicon Schottky barrier avalanche diodes

  • Author

    Goldwasser, R.E. ; Lee, Craig A.

  • Volume
    15
  • fYear
    1969
  • fDate
    1969
  • Firstpage
    16
  • Lastpage
    16
  • Abstract
    Silicon Schottky barrier avalanche diodes have been fabricated which are superior in many important respects to comparable diffused avalanche diodes. These, diodes employ a platinum-silicide, metallurgical barrier and are mounted with the barrier--junction metallization thermally compression bonded to the copper heat-sink. Diodes have been made with transit-time operation from low X-band through K-band. At X-band CW efficiencies in excess of 5% at the relatively low current density of 500 A/cm2have been achieved. The thermal impedance was lower than for similarly mounted diffused diodes and for the above performance figures a junction temperature rise of only 150°C was observed. At Ku and K-band efficiencies of ∼2% were achieved and although the current densities were higher junction temperature rises above ambient were less than 200°C.
  • Keywords
    Bonding; Copper; Current density; Impedance; K-band; Metallization; Schottky barriers; Schottky diodes; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1969 International
  • Conference_Location
    IEEE
  • Type

    conf

  • Filename
    1475961