DocumentCode
439931
Title
Silicon Schottky barrier avalanche diodes
Author
Goldwasser, R.E. ; Lee, Craig A.
Volume
15
fYear
1969
fDate
1969
Firstpage
16
Lastpage
16
Abstract
Silicon Schottky barrier avalanche diodes have been fabricated which are superior in many important respects to comparable diffused avalanche diodes. These, diodes employ a platinum-silicide, metallurgical barrier and are mounted with the barrier--junction metallization thermally compression bonded to the copper heat-sink. Diodes have been made with transit-time operation from low X-band through K-band. At X-band CW efficiencies in excess of 5% at the relatively low current density of 500 A/cm2have been achieved. The thermal impedance was lower than for similarly mounted diffused diodes and for the above performance figures a junction temperature rise of only 150°C was observed. At Ku and K-band efficiencies of ∼2% were achieved and although the current densities were higher junction temperature rises above ambient were less than 200°C.
Keywords
Bonding; Copper; Current density; Impedance; K-band; Metallization; Schottky barriers; Schottky diodes; Silicon; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1969 International
Conference_Location
IEEE
Type
conf
Filename
1475961
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