DocumentCode

439949

Title

Circuit testing with an electron beam

Author

Engel, Jonathan M.

Volume

15

fYear

1969

fDate

1969

Firstpage

10

Lastpage

11

Keywords

Circuit testing; Electron beams;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1969 International

Conference_Location

IEEE

Type

conf

Filename

1476096