DocumentCode

440024

Title

Network representation of the large-signal transient response of MOS transistors

Author

Lindholm, F.A. ; Arreola, J.I.

Volume

21

fYear

1975

fDate

1975

Firstpage

6

Lastpage

6

Keywords

Automatic testing; Circuit simulation; Circuit testing; Contracts; MOS capacitors; MOSFETs; Transient response;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1975 International

Conference_Location

IEEE

Type

conf

Filename

1478336