Title :
Experimental determination of the bandgap in the base region of bipolar transistors
Author :
Slotboom, J.W. ; de Graaff, H.C.
Keywords :
Absorption; Bipolar transistors; Cutoff frequency; Impurities; Ion implantation; Photonic band gap; Reliability theory; Silicon devices; Temperature distribution; Temperature measurement;
Conference_Titel :
Electron Devices Meeting, 1975 International
Conference_Location :
IEEE
