DocumentCode
440034
Title
Experimental determination of the bandgap in the base region of bipolar transistors
Author
Slotboom, J.W. ; de Graaff, H.C.
Volume
21
fYear
1975
fDate
1975
Firstpage
14
Lastpage
15
Keywords
Absorption; Bipolar transistors; Cutoff frequency; Impurities; Ion implantation; Photonic band gap; Reliability theory; Silicon devices; Temperature distribution; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1975 International
Conference_Location
IEEE
Type
conf
Filename
1478346
Link To Document