Title :
Base resistance, parasitic diode shunting and high-level PNP injection effects on I2L performance
Author :
Bhattacharyya, A.
Keywords :
Circuit simulation; Delay effects; Diodes; Doping; Immune system; Inverters; Ion implantation; MOSFETs; Probes; Propagation delay;
Conference_Titel :
Electron Devices Meeting, 1976 International
Conference_Location :
IEEE
